Radiation damage bigger problem in microelectronics than previously thought
Friday, July 20, 2012 - 21:00
in Physics & Chemistry
The amount of damage that radiation causes in electronic materials may be at least 10 times greater than previously thought. That is the surprising result of a new characterization method that uses a combination of lasers and acoustic waves to that allows scientists to peer through solid materials to pinpoint the size and location of detects buried deep inside with unprecedented precision.