New form of electron-beam imaging can see elements that are 'invisible' to common methods
Monday, February 29, 2016 - 06:30
in Physics & Chemistry
Electrons can extend our view of microscopic objects well beyond what's possible with visible light—all the way to the atomic scale. A popular method in electron microscopy for looking at tough, resilient materials in atomic detail is called STEM, or scanning transmission electron microscopy, but the highly-focused beam of electrons used in STEM can also easily destroy delicate samples.