Depth Charge: Using Atomic Force Microscopy to Study Subsurface Structures

Over the past couple of decades, atomic force microscopy (AFM) has emerged as a powerful tool for imaging surfaces at astonishing resolutions -fractions of a nanometer in some cases. But suppose you're more concerned with what lies below the surface? Researchers at the National Institute of Standards and Technology have shown that under the right circumstances, surface science instruments such as the AFM can deliver valuable data about sub-surface conditions.

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