Nanowires as Sensors in New Type of Atomic Force Microscope
Monday, October 17, 2016 - 10:31
in Physics & Chemistry
A new type of atomic force microscope (AFM) uses nanowires as tiny sensors. Unlike standard AFM, the device with a nanowire sensor enables measurements of both the size and direction of forces. Physicists at the University of Basel and at the EPF Lausanne have described these results in the recent issue of Nature Nanotechnology.