Ultrafast Imaging of Complex Systems in 3-D at Near Atomic Resolution Becoming Increasingly Possible

It is becoming possible to image complex systems in 3-D with near-atomic resolution on ultrafast timescales using extremely intense X-ray free-electron laser (XFEL) pulses. One important step toward ultrafast imaging of samples with a single X-ray shot is understanding the interaction of extremely brilliant and intense X-ray pulses with the sample, including ionization rates.

Read the whole article on Newswise - Scinews

More from Newswise - Scinews