New angle on x-ray measurements
Monday, March 9, 2015 - 13:50
in Astronomy & Space
Criminal justice, cosmology and computer manufacturing may not look to have much in common, but these and many other disparate fields all depend on sensitive measurement of X-rays. Scientists have developed a new method to reduce uncertainty in X-ray wavelength measurement that could provide improvements awaited for decades. Accurate measurement of X-ray wavelength depends critically on the ability to measure angles very accurately and with very little margin for error.