Getting the point: Real-time monitoring of atomic-microscope probes adjusts for wear
Friday, April 1, 2011 - 11:03
in Physics & Chemistry
Scientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the microscopic probes used to study nanoscale structures in situ and as it's happening. Their technique can both dramatically speed up and improve the accuracy of the most precise and delicate nanoscale measurements done with atomic force microscopy (AFM)...