Researchers apply FIB-SEM technology to 3-D plant cell architecture imaging

Plant cells are beginning to look a lot different to Dr. A. Bruce Cahoon and his colleagues at Middle Tennessee State University (MTSU). They've adopted a new approach that combines the precision of an ion beam with the imaging capabilities of an electron beam to zoom in at micron-level resolution. Scientists who work with nanodevices have used focused ion beam–scanning electron microscopy (FIB-SEM) for decades, but it is only recently that biologists have begun to explore its capabilities. The researchers at MTSU are the first to optimize its use for plant cell imaging.

Read the whole article on Physorg

More from Physorg