Improved X-ray microscopy makes fluctuations visible

X-ray microscopy requires radiation of extremely high quality. In order to obtain sharp images instrument and sample must stay absolutely immobile even at the nanometer scale during the recording. Researchers at the Technische Universitaet Muenchen and the Paul Scherrer Institute in Villigen, Switzerland, have now developed a method that relaxes these hard restrictions. Even fluctuations in the material can be visualized. The renowned journal Nature now reports on their results.

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