New test measures key properties of polymer thin films and membranes

Wednesday, July 20, 2011 - 08:00 in Physics & Chemistry

(PhysOrg.com) -- Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a measurement technique that reliably determines three fundamental mechanical properties of near-nanoscale films. The technique, which highlights the challenge of making mechanical measurements on an object with at least one dimension comparable to the size of a virus, should enable better design and engineering for a variety of thin-film technologies, particularly reverse-osmosis membranes for water purification.

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