Neuroscientists identify synaptic defect in brain area involved in Fragile X syndrome

Researchers at India's National Centre for Biological Sciences (NCBS) and New York University's Center for Neural Science have identified novel synaptic defects in an area of the brain that is involved in the debilitating emotional symptoms of Fragile X Syndrome (FXS). FXS is the leading known genetic cause of autism and mental retardation.

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