New statistical technique improves precision of nanotechnology data
Wednesday, July 1, 2009 - 12:49
in Physics & Chemistry
A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future industrial applications.
Read the whole article on Physorg
More from Physorg
Related
- New statistical technique improves precision of nanotechnology dataWed, 1 Jul 2009, 9:14:25 EDT
- Just scratching the surface: New technique maps nanomaterials as they growTue, 4 Nov 2008, 14:22:02 EST
- Distinguishing single cells with nothing but lightWed, 1 Apr 2009, 0:40:23 EDT
- New method of self-assembling nanoscale elements could transform data storage industryThu, 19 Feb 2009, 14:50:07 EST
- Just a numbers game? Making sense of health statisticsFri, 10 Oct 2008, 17:42:57 EDT