Strengthening thin-film bonds with ultrafast data collection
Monday, October 20, 2014 - 08:01
in Physics & Chemistry
When studying extremely fast reactions in ultrathin materials, two measurements are better than one. A new research tool invented by researchers at Lawrence Livermore National Laboratory (LLNL), Johns Hopkins University and the National Institute of Standards and Technology (NIST) captures information about both temperature and crystal structure during extremely fast reactions in thin-film materials.