DARPA technology identifies counterfeit microelectronics
Wednesday, October 1, 2014 - 09:10
in Physics & Chemistry
Advanced software and equipment to aid in the fight against counterfeit microelectronics in U.S. weapons and cybersecurity systems has been transitioned to military partners under DARPA's Integrity and Reliability of Integrated Circuits (IRIS) program. Researchers with SRI International, an IRIS performer, announced today they have provided Advanced Scanning Optical Microscope (ASOM) technology to the Naval Surface Warfare Center (NSWC) in Crane, Indiana, where it will join an arsenal of laboratory equipment used to ensure the integrity of microelectronics.