Researchers open door to advanced molecular electronic metrology
Friday, April 12, 2013 - 08:30
in Physics & Chemistry
(Phys.org) —Continued advancements using a NIST-developed molecular-level fabrication technique are leading to new discoveries in the metrology for molecular electronics by advancing large-area (μm to mm range) connections to molecules (nm range). Researchers in the PML's Semiconductor and Dimensional Metrology Division have been able to build a simple bilayer molecular circuit, combining separately formed monolayers of organic materials on silicon and gold surfaces respectively to create a fully characterized molecular level device. Further, they were able to place copper atoms at specific locations within the bilayer device to test their influence on its electronic properties.