Researchers validate simplified lateral force calibration technique for atomic force microscopy
Thursday, March 29, 2012 - 08:31
in Physics & Chemistry
(PhysOrg.com) -- Researchers from the NIST Center for Nanoscale Science and Technology and the NIST Material Measurement Laboratory have demonstrated that a simpler technique for calibrating lateral sensitivity in an atomic force microscope (AFM) agrees with an earlier method developed at NIST to within 5 %.