Highlight: Polarization-modulated rectification at ferroelectric surfaces
Friday, June 4, 2010 - 12:42
in Physics & Chemistry
A combined electrostatic force and conductive atomic force microscopy study on single-crystalline ferroelectric HoMnO3 recently was published by users from Rutgers University and Chung-Ang University in South Korea, working collaboratively with the Electronic & Magnetic Materials & Devices Group at the Argonne National Laboratory.