Terahertz Waves Are Effective Probes for IC Heat Barriers
Wednesday, May 6, 2009 - 13:42
in Physics & Chemistry
(PhysOrg.com) -- By modifying a commonly used commercial infrared spectrometer to allow operation at long-wave terahertz frequencies, researchers at the National Institute of Standards and Technology discovered an efficient new approach to measure key structural properties of nanoscale metal-oxide films used in high-speed integrated circuits. Their technique, described in a recent paper,* could become an important quality-control tool to help monitor semiconductor manufacturing processes and evaluate new insulating materials.
Read the whole article on Physorg
More from Physorg
Related
- Terahertz waves are effective probes for IC heat barriersFri, 8 May 2009, 12:43:40 EDT
- Engineers demonstrate first room-temperature semiconductor source of coherent Terahertz radiationMon, 19 May 2008, 1:56:19 EDT
- Cracking a tough nut for the semiconductor industryTue, 23 Dec 2008, 17:49:21 EST
- Using a grating with a grade, engineers trap a rainbowFri, 27 Jun 2008, 17:28:49 EDT
- NIST 'stress tests' probe nanoscale strains in materialsTue, 25 Nov 2008, 17:09:16 EST