Terahertz Waves Are Effective Probes for IC Heat Barriers
Wednesday, May 6, 2009 - 20:42
in Physics & Chemistry
By modifying a commonly used commercial infrared spectrometer to allow operation at long-wave terahertz frequencies, researchers at NIST discovered an efficient new approach to measure key structural properties of nanoscale metal-oxide films used in high-speed integrated circuits.
Read the whole article on Newswise - Scinews
More from Newswise - Scinews
Related
- Terahertz waves are effective probes for IC heat barriersFri, 8 May 2009, 12:43:40 EDT
- Using a grating with a grade, engineers trap a rainbowFri, 27 Jun 2008, 17:28:49 EDT
- NIST 'stress tests' probe nanoscale strains in materialsTue, 25 Nov 2008, 17:09:16 EST
- PTB Terahertz calibration satisfies US laser manufacturerFri, 6 Nov 2009, 6:07:41 EST
- Team develops new metamaterial deviceTue, 24 Feb 2009, 12:07:55 EST