UB engineers prove that carbon nanotubes are superior to metals for electronics

Saturday, March 21, 2009 - 13:16 in Physics & Chemistry

In the quest to pack ever-smaller electronic devices more densely with integrated circuits, nanotechnology researchers keep running up against some unpleasant truths: higher current density induces electromigration and thermomigration, phenomena that damage metal conductors and produce heat, which leads to premature failure of devices...

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