Scientists determine how much damage memory devices can take in mass transit accidents

Thursday, December 8, 2016 - 16:52 in Physics & Chemistry

While investigating mass transit accidents, especially in air travel, National Transportation Safety Board (NTSB) officials often rely on digital clues left behind in flash memories of any and all electronic devices—both personal and professional—at a crash site. With the physical forces and high-temperature fires associated with many crashes, memory units are often damaged and sometimes unreadable.

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