Making a Point: Picoscale Stability in a Room-Temperature AFM
Tuesday, March 24, 2009 - 20:21
in Physics & Chemistry
A research team from NIST and the University of Colorado has shown how to detect and monitor the tiny amount of light reflected directly off the needle point of an atomic force microscope probe, and in so doing has demonstrated a 100-fold improvement in the stability of the instrument's measurements under ambient conditions, work that potentially affects a broad range of research from nanomanufacturing to biology.