Toward reliable probing of electrocatalysts: Identifying X-ray-induced artifacts in operando spectroscopy
Wednesday, July 2, 2025 - 06:46
in Physics & Chemistry
Operando X-ray spectroscopy is a powerful tool for probing electrocatalyst dynamics—but intense X-ray exposure can distort structural insights. A recent article reveals flux- and dose-dependent artifact thresholds and proposes practical protocols to ensure accurate, artifact-free measurements.