Accelerating nanoscale X-ray imaging of integrated circuits with machine learning

Thursday, June 1, 2023 - 14:52 in Physics & Chemistry

Researchers from MIT and Argonne National Laboratory have developed a machine learning technique that could greatly accelerate the process of nanoscale X-ray imaging of integrated circuits, potentially revolutionizing the way we manufacture and test electronics.

Read the whole article on Physorg

More from Physorg

Latest Science Newsletter

Get the latest and most popular science news articles of the week in your Inbox! It's free!

Check out our next project, Biology.Net