A robust, sensitive thin-film X-ray detector using 2-D layered perovskite diodes
In a new report on Science Advances, Hsinhan Tsai and a research team in materials, nanotechnology, nuclear engineering and X-ray science at the Los Alamos National Laboratory and the Argonne National Laboratory in the U.S. demonstrated a new thin film X-ray detector prototype. The set up contained highly crystalline two-dimensional (2-D) Ruddlesden-Popper (RP) phase layered perovskites and maintained a high diode resistivity of 1012 Ohm.cm, leading to a high X-ray detecting sensitivity of up to 0.276 C Gyair−1 cm−3. To promise revolutionary medical imaging with minimal health risks. The team collected the signals using the built-in potential and the results underpin the operation of existing robust primary photocurrent devices. The detectors generated substantial X-ray photon-induced open-circuit voltages as an alternate detecting mechanism. The work suggests a new generation of X-ray detectors based on low-cost, layered perovskite thin films for future X-ray imaging technologies.