Method detects defects in 2-D materials for future electronics, sensors
Tuesday, January 28, 2020 - 02:30
in Physics & Chemistry
To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2-D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2-D materials.