Three-dimensional, direction-dependent force measurement at the subatomic scale
Atomic force microscopy (AFM) is an extremely sensitive technique that allows us to image materials and/or characterize their physical properties on the atomic scale by sensing the force above material surfaces using a precisely controlled tip. However, conventional AFM only provides the surface normal component of the force (the Z direction) and ignores the components parallel to the surface (the X and Y directions). To fully characterize materials used in nanoscale devices, it is necessary to obtain information about parameters with directionality, such as electronic, magnetic, and elastic properties, in more than just the Z direction. That is, it is desirable to measure these parameters in the X and Y directions parallel to the surface of a material as well. Measuring the distribution of such material parameters on the atomic scale will increase our understanding of chemical composition and reactions, surface morphology, molecular manipulation, and nanomachine operation.