Imec advances drive current in vertical 3D NAND memory devices
Tuesday, December 8, 2015 - 08:41
in Physics & Chemistry
At this week's IEEE IEDM conference, nano-electronics research center imec showed for the first time the integration of high mobility InGaAs as a channel material for 3D vertical NAND memory devices formed in the plug (holes) with the diameter down to 45nm. The new channel material improves transconductance (gm) and read current which is crucial to enable further VNAND cost reduction by adding additional layers in 3D vertical architecture.