NIST gets new angle on X-ray measurements
Monday, March 9, 2015 - 12:50
in Physics & Chemistry
Criminal justice, cosmology and computer manufacturing may not look to have much in common, but these and many other disparate fields all depend on sensitive measurements of X-rays. Scientists at the National Institute of Standards and Technology (NIST) have developed a new method to reduce uncertainty in X-ray wavelength measurement that could provide improvements awaited for decades.