Atomic force microscope systems take a tip from nanowires
Monday, May 26, 2014 - 07:01
in Physics & Chemistry
(Phys.org) —In response to requests from the semiconductor industry, a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and other endeavors.