Researchers produce first ever atom-by-atom simulation of ALD nanoscale film growth

Thursday, February 6, 2014 - 09:30 in Physics & Chemistry

Researchers at Tyndall National Institute, Ireland, have produced the first ever atom-by-atom simulation of nanoscale film growth by atomic layer deposition (ALD) – a thin-film technology used in the production of silicon chips.

Read the whole article on Physorg

More from Physorg

Learn more about

Latest Science Newsletter

Get the latest and most popular science news articles of the week in your Inbox! It's free!

Check out our next project, Biology.Net