Researchers develop new technique for probing subsurface electronic structure
Wednesday, January 15, 2014 - 08:31
in Physics & Chemistry
(Phys.org) —"The interface is the device," Nobel laureate Herbert Kroemer famously observed, referring to the remarkable properties to be found at the junctures where layers of different materials meet. In today's burgeoning world of nanotechnology, the interfaces between layers of metal oxides are becoming increasingly prominent, with applications in such high-tech favorites as spintronics, high-temperature superconductors, ferroelectrics and multiferroics. Realizing the vast potential of these metal oxide interfaces, especially those buried in subsurface layers, will require detailed knowledge of their electronic structure.