X-rays illuminate nitrogen's role in single-layer graphene
Thursday, November 29, 2012 - 07:30
in Physics & Chemistry
(Phys.org)—Researchers using x-rays to study a single-atom-thick layer of carbon, called graphene, have learned new information about its atomic bonding and electronic properties when the material is "doped" with nitrogen atoms. They show that synchrotron x-ray techniques can be excellent tools to study and better understand the behavior of doped graphene, which is being eyed for use as a promising contact material in electronic devices due to its many desirable traits, including a high conductivity and, most notably, tunable electronic properties.