New instrument brings long-sought improvements to EUV testing and calibration
Wednesday, October 17, 2012 - 08:01
in Astronomy & Space
(Phys.org)—NIST's ability to test and calibrate sensors in the extreme ultraviolet (EUV) range – wavelengths of key importance to space-weather observations and microchip lithography, among other fields – is about to improve dramatically with the arrival of a proven and powerful instrument.