Panasonic HIT photovoltaic cells demonstrate high PID resistance
Wednesday, September 19, 2012 - 09:04
in Physics & Chemistry
Panasonic Corporation today announced that its HIT photovoltaic module's high-level of resistance to potential induced degradation (PID) has been verified by the results of tests conducted within and outside the company. The test conditions set by the third party organization were very stringent among those applied for various PID tests reported by several organizations. The successful passing of such a severe endurance test has confirmed the high quality and high reliability of Panasonic HIT modules.