New method for imaging defects in magnetic nanodevices
Thursday, September 13, 2012 - 10:58
in Physics & Chemistry
(Phys.org)—A team of researchers from the NIST Center for Nanoscale Science and Technology, the Royal Institute of Technology, Stockholm, and the University of Maryland have demonstrated a microscopy method to identify magnetic defects in an array of magnetic nanostructures. The method represents an important step towards identifying, measuring, and correcting the magnetic properties of defective devices in future information storage technologies.