Refined measurement technique may increase precision and accuracy in computer chip manufacturing
Thursday, September 6, 2012 - 09:03
in Physics & Chemistry
(Phys.org)—A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers more effectively size up the myriad tiny switches packed onto chips' surfaces. The method, which makes use of multiple measuring instruments and statistical techniques, is already drawing attention from industry.