Imaging complex domain wall structures in magnetic nanostripes

Thursday, April 19, 2012 - 05:00 in Physics & Chemistry

(Phys.org) -- Researchers from the NIST Center for Nanoscale Science and Technology and Massachusetts Institute of Technology have used the scanning electron microscopy with polarization analysis (SEMPA) technique to provide the first direct images of the magnetic structure of highly twisted domain walls in patterned thin film magnetic nanowires.

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