Making A Point: Picoscale Stability In A Room-temperature AFM
Monday, March 30, 2009 - 13:35
in Physics & Chemistry
A research team has shown how to detect and monitor the tiny amount of light reflected directly off the needle point of an atomic force microscope probe, and in so doing has demonstrated a 100-fold improvement in the stability of the instrument's measurements under ambient conditions, work that potentially affects a broad range of research from nanomanufacturing to biology.