Seeing moire in graphene
Thursday, April 29, 2010 - 04:20
in Physics & Chemistry
Researchers at the National Institute of Standards and Technology (NIST) and the Georgia Institute of Technology have demonstrated that atomic scale moire patterns, an interference pattern that appears when two or more grids are overlaid slightly askew, can be used to measure how sheets of graphene are stacked and reveal areas of strain. The ability to determine the rotational orientation of graphene sheets and map strain is useful for understanding the electronic and transport properties of multiple layers of graphene, a one-atom thick form of carbon with potentially revolutionary semiconducting properties...