Method detects defects in 2D materials for future electronics, sensors
Monday, January 27, 2020 - 17:41
in Physics & Chemistry
To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2D materials.